![tc3.jpg tc3.jpg](http://digiworlddesign.com/product_images/uploaded_images/tc3.jpg)
基本功能:
可选功能:
- 作为第三方监测接触式读卡器和卡之间交互的数据并解析
应用领域:
- 接触式智能卡的底层测试
- ISO 7816, SWP, EMV等接触式卡片测试
MP300 TC3的主要特性:
- 模拟接触式智能卡读取装置,或者CLF
- 支持ISO 7816-3, USB 2.0 和USB-IC, SWP/S-HDLC/HCI 协议以及各种存储晶片
- 支持ETSI TS 102 613和TS 102 622 规范
- 开放的系统来执行客户自订的协议
- 可以调节所有电气参数
- 监测ISO 7816-3, USB和SWP介面,全面的协议分析功能
- 先进的底层参数测量特性(开路/短路,电消耗,漏电流,等大量可调参数)
- 精确的时序测量特性
- 提供硬件Sequencer,完美的回路执行测试scenario及进一步的协议测试
- 开放式平台:客户可以将MP300 TC3集成到自己的测试平台
- 同时提供MP Manager配套软件,客户无需程式设计即可完全控制测试仪
- 可以选配各种测试套件,包括针对ISO 7816-3, VISA Level 1, EMV Level 1, ETSI TS 102 613 和ETSI TS 102 622等相容性检测的测试案例
- 完美的循环测试功能
- 可视化跟踪和分析
- 强大的测量能力
- 可在通信中加入干扰信号
- 精心设计的高精确度能够放大细微细节,不管问题是关于信号时序或电性能方面
- 独家专业硬件设计支持了无可比拟的兼容性
当面对着最困难的测试环境时,您可以完全信任MP300 TC3的极高性能.
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MP300 TC3 Specifications
Physical Parameters
Voltages
- Vcc : 0V to 10V
- Vol : 0V to 5V , Each contact can be adjusted independently
- Voh : 1V to 7V , Each contact can be adjusted independently
- Vil : 0.2V to 5V
- Vih : 1V to 6.8V
Frequency supported by MP300 TC3
- ISO 7816 clock frequency 10kHz to 20MHz
- ISO 7816 clocy duty cycle 30% to 70%
Rise and fall times
- Vcc From 20ns to 1.8V/ms
- C2, C3, C4, C6, C7, C8 From 10ns to 5μs (500μs on C2) , Each contact can be adjusted independently
Pin states tested by MP300 TC3
- All pins are independent fom each other, and can be separately managed
ISO 7816 communication parameters
- ETU width : From 1 to 4096 clock cycles (bit sampling adjustable)
- BGT, initial ETU width : Adjustable in clock cycles
- BWT, CWT, EGT, RGT, WWT : Adjustable in ETUs
- Clock stop at high or low state : Adjustable
- Clock stop tG and tH timings : Adjustable in clock cycles
- Parity control : Can be forced to 0,1, odd, even
- Input parity error checking : Can be disabled
- Pull-up resistor 5kΩ or 20kΩ by fixed pull-up resistor,
- Any value between 1kΩ and 100kΩ can be emulated
SWP communication parameters of MP300 TC3
- Baudrate : Adjustable from 49kbps to 1.9Mbps
- SWP duty cycle (definition of SWP S1 high and low states duration) : Adjustable from 0% to 50%
- SWP S2 detection threshold : Adjustable from 1nA to 1.1mA
- Activation time, P2, P3 timings : Adjustable
USB-IC parameters
- USB-IC specific attachment procedure : Managed by the tester
- Voltage classes supported : 1.8V and 3.0V
Spy feature of MP300 TC3
- Accuracy : 20ns
- Signals displayed
- Signals C1, C2, C3, C4, C6, C7, C8
- SWP S1, SWP S2
- Trigger in
- Trigger out
- Protocols supported by MP300 TC3
- ISO/IEC 7816-3, SWP, USB 2.0 (simultaneous spy possible without accuracy damage)
- Type of events displayed
- Logical state change
- Characters (ISO/IEC 7816, SWP, USB 2.0, USB-IC)
- Modification of baudrate
- Clock frequency detection
- Analog representation of the signals
- I/O direction
Electrical tests of MP300 TC3
- Open/short test
- Available contacts : Contact C1, C2, C3, C4, C5, C6, C7, C8
- Forced current : Adjustable between –500μA and 500μA
- Leakage current measurement
- Available contacts : Contact C1, C2, C3, C4, C6, C7, C8
- Measurement ranges :
- Voltage measurement
- Available contacts : Contacts C1, C2, C3, C4, C6, C7, C8
- Range available : +/- 10V
- Modes available
- Dynamic mode : we give you an analog like vision of the voltage on the pin you chose from the moment you chose
- Static mode : we give you the instant voltage value
- Burst mode : 512000 voltage measurements are made with 40ns in between, on C1 and C6, to give an analog like display of the studied signal
- Current measurement
- Available contacts : Contacts C1, C2, C3, C4, C6, C7, C8
- Ranges available :
- +/- 100mA
- +/- 25mA
- +/- 5mA
- +/- 500μA
- Modes available :
- Dynamic mode : we give you an analog like vision of the current on the pin you chose from the moment you chose
- Static mode : we give you the instant current value on the selected contact
- Burst mode : 512000 current measurements are made with 40ns in between, on C1 and C6, to give an analog like display of the studied signal
- Parametric tests
- Available contacts : Contacts C1, C2, C3, C4, C6, C7, C8
- Modes available :
- Force a current, measure a voltage
- Force a voltage, measure a current
- SWP specific measurement functions
- S2 signal characterisation Measurement of minimum and maximum values of the current on the S2 signal during a given period
Logical tests by MP300 TC3
- Anti tearing test
- Simulate the chip's immunity against tearing from the reader
- Timing measurement
- Measure the chip's response to a command
- Concurrent I/O testing
- Simultaneous sending of characters in ISO/IEC 7816 and SWP, with a user defined time offset (can be 0 ns)
- Personalisation assisted by hardware
- Do not lose a microsecond while sending data to the chip thanks to the hardware assisted data sending mechanism
- SWP framing tests
- Possibility to send frames at a bit per bit level, enabling the sending of data without bit stuffing, or with CRC errors.
Sequencer tests supported by MP300 TC3
- Generation of glitches on Vcc, C3, C6
- Modification at a user defined moment of the state of a pin
- Sending out of standard frames/provoking collisions
- Creation of custom activation/deactivation sequences
- Generation of parity errors on transmission, simulation of parity errors on reception
Management of triggers
- Sudden modification of an electronic parameter
- Definition of the time between two commands
Triggers function of MP300 TC3
- The MP300 TC3 offers 5 triggers, to synchronise or to be synchronised by external laboratory devices (oscilloscopes,...)
Communication parameters of MP300 TC3
- USB 2.0
- TCP/IP 10/100 Mbps
- RS 232
Software development of MP300 TC3
- Remote development (the code is executed from the PC)
- Elements available
- MPSDK .NET library available on demand
- Communication Dll supplied
- Supported programming languages :
- C, C++, VB, Java, .NET,
- Any language that supports Dll
- Embedded development (the code is executed directly by the MP300)
- Recommended cross compiler Windriver compiler (prefered version : 4.4b)
MP300 TC3 User interface :
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